Rainbow-electronics ATmega64L Manual de usuario descargar pdf (Pagina 229)

229

ATmega16(L)

2466B–09/01

Scanning the ADC

Figure 123 shows a block diagram of the ADC with all relevant control and observe signals. The Boundary-scan cell from

Figure 122 is attached to each of these signals. The ADC need not be used for pure connectivity testing, since all analog

inputs are shared with a digital port pin as well.

Figure 123. Analog to Digital Converter

The signals are described briefly in Table 91.

Table 90. Boundary-scan Signals for the Analog Comparator

Signal

Name

Direction as Seen from

the Comparator Description

Recommended Input

when not in Use

Output Values when

Recommended Inputs are Used

AC_IDLE Input Turns off Analog

comparator when true

1 Depends upon µC code being

executed

ACO Output Analog Comparator

Output

Will become input to µC

code being executed

ACME Input Uses output signal from

ADC mux when true

0 Depends upon µC code being

executed

ACBG Input Bandgap Reference

enable

0 Depends upon µC code being

executed

10-bit DAC +

AREF

PRECH

DACOUT

COMP

MUXEN_7

ADC_7

MUXEN_6

ADC_6

MUXEN_5

ADC_5

MUXEN_4

ADC_4

MUXEN_3

ADC_3

MUXEN_2

ADC_2

MUXEN_1

ADC_1

MUXEN_0

ADC_0

NEGSEL_2

ADC_2

NEGSEL_1

ADC_1

NEGSEL_0

ADC_0

EXTCH

10x 20x

G10 G20

ACLK

AMPEN

2.56V

ref

IREFEN

AREF

VCCREN

DAC_9..0

ADCEN

HOLD

PRECH

GNDEN

PASSEN

ACTEN

COMP

SCTEST

ADCBGEN

To Comparator

1.22V

ref

AREF

ADHSM

1 2 ... 224 225 226 227 228 229 230 231 232 233 234 ... 297 298

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