
137
AT8xC5132
4173A–8051–08/02
Note: 1. Typical values are obtained using V
DD
= 3V and T
A
= 25°C. They are not tested and
there is no guarantee on these values.
Figure 112. I
DD
/I
DL
Versus X
TAL
Frequency; V
DD
= 2.7 to 3.3V
I
LI
Input Leakage Current (P0,
ALE, MCMD, MDAT, MCLK,
SCLK, DCLK, DSEL, DOUT)
10 µA 0.45 < V
IN
< V
DD
I
TL
Logical 1 to 0 Transition
Current
(P1, P2, P3, P4 and P5)
-650 µA Vin = 2.0V
R
RST
Pull-down Resistor 50 90 200 kΩ
C
IO
Pin Capacitance 10 pF T
A
= 25°C
V
RET
V
DD
Data Retention Limit 1.8 V
I
DD
Operating Current TBD TBD mA
12 MHz, V
DD
< 3.3V
16 MHz, V
DD
< 3.3V
20 MHz, V
DD
< 3.3V
I
DL
Idle Mode Current TBD TBD mA
12 MHz, V
DD
< 3.3V
16 MHz, V
DD
< 3.3V
20 MHz, V
DD
< 3.3V
I
PD
Power-down Current TBD TBD µAV
RET
< V
DD
< 3.3V
Table 124. Digital DC Characteristics V
DD
= 2.7 to 3.3V , T
A
= -40° to +85°C
Symbol Parameter Min Typ
(1)
Max Units Test Conditions
max Active mode (mA)
typ Active mode (mA)
max Idle mode (mA)
typ Idle mode (mA)
TBD
TBD
TBD
0
I
DD
/I
DL
(mA)
Frequency at XTAL (MHz)
2681041412 2016 18
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