MAX1127
Quad, 12-Bit, 65Msps, 1.8V ADC with
Serial LVDS Outputs
20 ______________________________________________________________________________________
Frame Alignment Output (FRAMEP, FRAMEN)
The MAX1127 provides a differential frame alignment
signal that consists of FRAMEP and FRAMEN. As shown
in Figure 4, the rising edge of the frame alignment sig-
nal corresponds to the first bit (D0) of the 12-bit serial
data stream. The frequency of the frame alignment sig-
nal is identical to the frequency of the sample clock.
Serial Output Data (OUT_P, OUT_N)
The MAX1127 provides its conversion results through
individual differential outputs consisting of OUT_P and
OUT_N. The results are valid 6.5 input clock cycles
after the sample is taken. As shown in Figure 3, the out-
put data is clocked out on both edges of the output
clock, LSB (D0) first. Figure 5 provides the detailed ser-
ial output timing diagram.
Output Data Format (
T
/B), Transfer Functions
The MAX1127 output data format is either offset binary or
two’s complement, depending on the logic input T/B.
With T/B low, the output data format is two’s comple-
ment. With T/B high, the output data format is offset bina-
ry. The following equations, Table 2, Figure 6, and Figure
7 define the relationship between the digital output and
the analog input. For two’s complement (T/B = 0):
and for offset binary (T/B = 1):
where CODE
10
is the decimal equivalent of the digital
output code as shown in Table 2. FSR is the full-scale
range as shown in Figures 6 and 7.
Keep the capacitive load on the MAX1127 digital out-
puts as low as possible.
LVDS and SLVS Signals (SLVS/
LVDS
)
Drive SLVS/LVDS low for LVDS or drive SLVS/LVDS
high for scalable low-voltage signaling (SLVS) levels at
the MAX1127 outputs (OUT_P, OUT_N, CLKOUT_P,
CLKOUT_N, FRAMEP_, and FRAMEN_). See the
Electrical Characteristics table for LVDS and SLVS out-
put voltage levels.
LVDS Test Pattern (LVDSTEST)
Drive LVDSTEST high to enable the output test pattern
on all LVDS or SLVS output channels. The output test
pattern is 0000 1011 1101 MSB→LSB. As with the ana-
log conversion results, the test pattern data is output
LSB first. Drive LVDSTEST low for normal operation
(test pattern disabled).
(21 paginas)
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